[126]

  D. Zito, A. Fonte, D. Pepe, "Microwave Active Inductors", IEEE Microwave and Wireless Components Letters, Vol 19, Issue 7, July 2009 pp. 461 - 463;

[125]

  A. Fonte and D. Zito, “High-Q Millimeter-wave CMOS Active Inductor”, 5th IEEE Conference on PhD Research in Microelectronics and Electronics (PRIME), Cork (Ireland), 12-17 July 2009;

[124]

  M. Mincica, G. Agnese, D. Pepe, D. Zito,  “CMOS Correlation Receiver for UWB Pulse Radar”, 5th IEEE Conference on PhD Research in Microelectronics and Electronics, Cork (Ireland), 12-17 July 2009;

[123]

  D. Zito, D. Pepe, M. Mincica, F. Zito, D. De Rossi, ”Wearable SoC UWB  (3.1-10.6 GHz) Radar for Cardiopulmonary Monitoring”, invited at IEEE  International Conference on VLSI-SoC 2008, 13-15 October, Rhodes  (Grecia), 2008

[122]

  G. Tasselli, F. Alimenti, A. Fonte, D. Zito, L. Roselli, D. De Rossi, A. Lanatà, B. Neri, A. Tognetti, "Wearable Microwave Radiometers for Remote Fire Detection: System-on-Chip (SoC) Design and Proof of the Concept" IEEE Proc. of the 30th International Conference of the IEEE Engineering in Medicine and Biology Society, 20-24 August 2008, Vancouver, British Columbia, Canada;

[121]

  A. Fonte, D. Zito, F. Alimenti, “CMOS Microwave Radiometer: Experiments on Down-Conversion and Direct Detections”, the IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2008, 31 August – 3 September 2008, Malta;

[120]

  F. Alimenti, D. Zito, A. Boni, M. Borgarino, A. Fonte, A. Carboni, S. Leone, M. Pifferi, L. Roselli, B. Neri, R. Menozzi, “System-on-Chip Microwave Radiometer for Thermal Remote Sensing and its Application to the Forest Fire Detection”, the IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2008, 31 August – 3 September 2008, Malta;

[119]

  D. Zito, D. Pepe, M. Mincica, F. Zito, D. De Rossi, A. Lanata, E.P. Scilingo, A. Tognetti, "Wearable system-on-a-chip UWB radar for contact-less cardiopulmonary monitoring: Present status", 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBS) 20-25 Aug. 2008, Vancouver, British Columbia, Canada, pp. 5274 - 5277

[118]

  E. P. Scilingo, A. Lanatà, D. Zito, D. Pepe, M. Mincica, F. Zito, D. De  Rossi, “Wearable monitoring of cardiopulmonary activity through radiant  sensing”, invited at IEEE International Workshop on Wearable Micro and  Nanosystems for Personalised Health (pHealth) 2008, Valencia (Spain),  May 21-23, 2008.

[117]

D. Zito, D. Pepe, T. Taris, J.-B. Begueret, Y. Deval, B. Neri, D. Belot, “A Novel LNA Topology with Transformer-based Input Integrated Matching and its 60-GHz Millimeter-wave CMOS 65-nm Design”, accepted for presentation at the IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2007, to be held on 11-14 December 2007, Marrakech (Marocco);

[116]

D. Zito, A. Fonte, B. Neri, “Advanced Model and RF-CMOS Designof the Boot-Strapped Inductor”, accepted for presentation at the IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2007, to be held on 11-14 December 2007, Marrakech (Marocco);

[115]

D. De Rossi, A. Lanata, E.P. Scilingo, D. Zito, D. Pepe, B. Neri,  “An ultra wide bandwidth wearable system for cardiopulmonary monitoring”, invited at the 4th International Conference on Personalised Healthcare (pHeath) - IEEE Engineering in Medicine and Biology Society - Porto Carras, Greece, 20-22 June 2007;

[114]

D. Zito, F. Alimenti, A. Fonte, B. Neri, D. De Rossi, A. Lanata, A. Tognetti, “Wearable System-on-a-Chip Radiometer for Remote Temperature Sensing and its Application to the Safeguard of Emergency Operators”, IEEE Proc. of the 29th International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon (France), 23 - 26 August 2007, pp. 5751-5754;

[113]

D. Zito, D. Pepe, B. Neri, D. De Rossi, A. Lanata, A. Tognetti E. Scilingo, “Wearable System-on-a-Chip UWB Radar for Health Care and its Application to the Safety Improvement of Emergency Operators”, accepted for presentation at the 29th International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon (France), 23 - 26 August 2007, pp. 2651-2654;

[112]

F. Barale and D. Zito, “UWB 3.1-10.6 GHz CMOS LNA”, IEEE 3rd Conference on PhD Research in Microelectronics and Electronics, Bordeaux (France), 2-5 July 2007;

[111]

F. Zito, D. Zito and D. Pepe, “UWB 3.1-10.6 GHz CMOS Transmitter for System-on-a-chip Nano-Power Pulse Radars”, IEEE 3rd Conference on PhD Research in Microelectronics and Electronics, Bordeaux (France), 2-5 July 2007;

[110]

 A. Fonte and D. Zito, “1-V 13-GHz Ultra Low Noise Amplifier for System-on-a-Chip Radiometer in CMOS 90 nm”, IEEE 3rd Conference on PhD Research in Microelectronics and Electronics, Bordeaux (France), 2-5 July 2007;

[109]

F. Alimenti, A. Fonte, D. Zito,  B. Neri, “Feasibility Study and Design of a Low-cost System-on-a-Chip Radiometer on Silicon”, IEEE International Waveform Diversity & Design (WDD) Conference, 4-8 June 2007, Pisa (Italy), pp. 37-41;

[108]

D. Zito, D. Pepe, B. Neri, D. De Rossi, “Feasibility Study of a Low-cost System-on-a-Chip UWB Pulse Radar on Silicon for Heart Monitoring”, IEEE International Waveform Diversity & Design (WDD) Conference 2007, 4-8 June 2007, Pisa, Italy, pp. 32-36;

[107]

D. Zito, D. Pepe, B. Neri, D. De Rossi, A. Lanatà, “Wearable System-on-a-Chip Pulse Radar Sensors for the Health Care: System Overview”, IEEE International Conference on Advanced Information Networking and Applications (International Workshop on Smart Homes and Tele-Health),  Niagara Falls (Canada), May 21th-23rd, 2007, pp. 766-769;

[106]

D. Zito, D. Pepe, B. Neri, “RFID Systems: Passive vs. Active and a Novel Low-Power RF Transceiver for IEEE 802.15.4 (ZigBee) Standard Based Applications", Journal of Low Power Electronics, American Scientific Publishers (ASP), Vol. 3, Is. 1, April 2007, pp. 96-105;

[105]

G. Scandurra, C. Ciofi, B. Neri and D. Zito, “Modified CMOS boot-strapped inductor”, International Journal of Circuit Theory and Applications, Wiley, Volume 35, Issue 2, March/April 2007, pp. 391-404;

[104]

D. Zito, D. Pepe, B. Neri, “High-Performance VCO for 5-GHz WLANs in 0.35 um CMOS Standard Technology”, IEEE Proc. of the International Conference on Electronics, Circuits and Systems (ICECS) 2006, Nice (FR), 10-13 December 2006, pp. 188-191;

[103]

D. Zito, D. Pepe, B. Neri, “Low-Power RF Transceiver for IEEE 802.15.4 (Zigbee) Standard Applications”, IEEE Proc. of the International Conference on Electronics, Circuits and Systems (ICECS) 2006, Nice (FR), 10-13 December 2006, pp.1312-1315;

[102]

D. Zito, D. Pepe, B. Neri, “Wide-Band Frequency-Independent Equivalent Circuit Model for Integrated Spiral Inductors on (Bi)CMOS Technology”, IEEE Proc. of the International Conference on Electronics, Circuits and Systems (ICECS) 2006, Nice (FR), 10-13 December 2006, pp.478-481;

[101]

D. Zito, D. Pepe, B. Neri and G. Scandurra, “Modeling and Design of the CMOS Boot-Strapped Inductor for 5-6 GHz Applications”, IEEE Proc. of the International Conference on Electronics, Circuits and Systems (ICECS) 2006, Nice (FR), 10-13 December 2006, pp. 471-474;

[100]

D. Zito and B. Neri, “RF Switch on Standard SiGe-CMOS Technology for System-on-a-chip Radio Transceivers”, IEEE Proceeding of the Bipolar / BiCMOS Circuits and Technology Meeting (BCTM) 2006, Maastricht (NL), 8-11 October 2006, pp. 209-212;

[99]

D. Zito and B. Neri, “5-GHz WLAN Standards Compliant Image Reject Radio Receiver on Low-cost SiGe-CMOS Technology”, IEEE Proceeding of the Bipolar / BiCMOS Circuits and Technology Meeting  (BCTM) 2006, Maastricht (NL), 8-11 October 2006, pp. 267-270;

[98]

D. Zito and B. Neri, “Single-chip Radio Transceivers on Silicon for Next Generation Wireless Interfaces: a Case Study for 5-GHz WLANs”, IEEE Proceeding of the Microwave Mediterranean Symposium (MMS) 2006, Genova (IT), 19-21 September 2006, pp. 455-458;

[97]

D. De Rossi, A. Lanatà, U. Mengali, B. Neri, D. Pepe, E. P. Scilingo, D. Zito, “Wearable Wireless Sensors for Human Health Care and Safeguard: the case study of System-on-a-chip UWB Micro-power Radars”, Proceeding of the 101st AEIT Conference (namely,  Convegno Nazionale della Federazione Italiana di Elettrotecnica, Elettronica, Automazione, Informatica e Telecomunicazioni) 2006, Capri (IT), 16-20 September 2006;

[96]

D. Zito, B. Neri, R. Massini, “54 dB Image Rejection Fully Integrated Receiver for Multi-standard 5-GHz WLANs”, IEEE Proceeding of the European Microwave Integrated Circuits Conference (EuMIC) 2006, Manchester (UK), 10-13 September 2006, pp.187-189;

[95]

D. Zito and B. Neri, “Single-chip RF Front-end with T/R Switch on Standard Silicon Technology for 5-GHz WLANs”, IEEE Proceeding of the European Microwave Conference (EuMC) 2006, Manchester (UK), 10-13 September 2006, pp.1660-1663;

[94]

D.Zito, G. Devita and B. Neri, “A New Ultra Low-power RF Receiver Topology for Wireless Communications Systems”, IEEJ Proceeding of International Analog VLSI Workshop, Bordeaux, 19-21 October 2005;

G. Scandurra, C. Ciofi and D. Zito, “A New Topology for Transformer Based CMOS Active Inductances”, IEEE International Conference on Ph.D. Research In Micro-Electronics & Electronics 2005 (PRIME 2005), Lausanne, 25-28 July 2005, Switzerland, Vol. 1, pp. 1-4;

D. Zito, F. D’Ascoli and B. Neri, “Fully Integrated RF Front-end for WLAN: A New Step torward Single-Chip Transceivers”, IEEE International Conference on Ph.D. Research In Micro-Electronics & Electronics 2005 (PRIME 2005), Lausanne, 25-28 July 2005, Switzerland, Vol. 1, pp. 157-160;

D. Zito, F. D’Ascoli, B. Neri and S. Ciucci, “High Image Rejection Fully Integrated Heterodyne Receiver Front-end for 5-6 GHz Wireless LAN”, IEEE International Symposium on Signals, Circuits and Systems 2005 (ISSCS 2005), Iasi, 15-14 July 2005, Romania, pp. 259-262;

D. Zito, F. D’Ascoli and B. Neri, “A Novel Fully Integrated Antenna Switch for 5-6 GHz Wireless LAN Systems”, IEEE International Symposium on Signals, Circuits and Systems 2005 (ISSCS 2005), Iasi, 15-14 July 2005, Romania, pp.379-382;

L.Benedettini, B. Neri and D. Zito, “5.25 GHz SiGe-CMOS 0.35 µm Fully Integrated Power Amplifier”, Proceedings of IEEE International Conference on Signals and Electronic Systems 2004 (ICSES 2004), Poznan (PL), 13-15 Sept. 2004, pp. 509-512;

L. Fanucci, E. Greco, N. Nardini, B. Neri, G. Scandurra and D. Zito, “5.25 GHz Fully Integrated Heterodyne Down-converter with Hi-image Rejection”, Proceedings of IEEE International Conference on Signals and Electronic Systems 2004 (ICSES 2004), Poznan (PL), 13-15 Sept. 2004, pp. 505-508;

D. Zito, F. De Bernardinis and B. Neri, “Modeling and Design of a Tunable high Q LNA for WLAN”, Proceedings of IEEE International Conference on Signals and Electronic Systems 2004 (ICSES 2004), Poznan (PL), 13-15 Sept. 2004, pp.253-256;

C. Ciofi, G. Giusi, G. Scandurra and B. Neri, “Dedicated instrumentation for high sensitivity, Low Frequency Noise Measurement systems”, Fluctuations and Noise Letters, World Scientific, June 2004, pp. 385-402; 

L. Fanucci, A. Hopper, B. Neri and D. Zito, “A Novel Fully Integrated Antenna Switch for Wireless Systems”, IEEE European Solid State Device and Technologies Conference 2003 (ESSDERC 2003), Lisboa (Portugal) 16-18 September 2003;

F.Crupi, B.Neri, “Gate current noise evolution and dielectric breakdown of MOS microstructures”, 17th International Conference on Noise and Fluctuations, Prague, August 18-22 2003, vol. 1, pp. 775-780;

S. Di Pascoli, L. Fanucci, B. Neri and D. Zito, “Base coupled differential amplifier: a new topology for RF integrated LNA”, International Journal of Circuit Theory and Applications, Wiley, July/August 2003, Volume 31, Issue 4, pp.351-360; 

S. Di Pascoli, L. Fanucci, B. Neri, G. Scandurra and D. Zito, “Single chip 1.8 GHz band pass LNA with temperature self-compensation”, IEEE International Symposium on Signals, Circuits and Systems 2003 (SCS 2003), Iasi (Romania), 10-11 July 2003, Vol. 1, pp. 121-124;

S. Di Pascoli, L. Fanucci, F. Giusti, B. Neri and D. Zito, “Fully integrated heterodyne RF receiver for ISM band applications”, IEEE International Symposium on Signals, Circuits and Systems 2003 (SCS 2003), Iasi (Romania), 10-11 July 2003, Vol. 1, pp. 125-128; 

C.Ciofi, B.Neri, “Low-frequency noise measurements: applications methodologies and instrumentation”, The International Society for Optical Engineering, 2003, Santa Fe, vol. 5113, pp. 350-367;

G. Iannaccone, F. Crupi, B. Neri, S. Lombardo, “Theory and Experiment of Suppressed Shot Noise in Stress-Induced Leakage Currents”, IEEE Transactions on Electron Devices, May 2003, num. 5, vol. 50, pp. 1363-1369;

S. Di Pascoli, L. Fanucci, B. Neri and D. Zito, “A New Differential LNA Topology for Wireless Applications”, IEEE International Conference on Electronics, Circuit and Systems 2002 (ICECS 2002), Dubrovnik (Croatia), 15-18 Sept. 2002;

S. Di Pascoli, F. Giusti L. Fanucci, B. Neri, and , D. Zito, “A Single-Chip 1.8 GHz Image Reject RF Receiver Front-end with Boot-Strapped Inductors”, IEEE International Conference on Electronics, Circuit and Systems 2002 (ICECS 2002), Dubrovnik (Croatia), 15-18 Sept. 2002, vol. 1, pp. 77-80;

S. Di Pascoli, L. Fanucci, B. Neri and D. Zito,, “A New Differential LNA Topology for Wireless Applications”, ICECS 2002, Dubrovnic 2002 vol. 1, pp. 105-108;

F. Crupi, G. Iannaccone, C. Ciofi, B. Neri, S. Lombardo and C. Pace, “Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitors”, Solid-State Electronics, 2002, num. 11, vol. 46, pp. 1807-1813;

F. Crupi, G. Iannaccone, B. Neri, S. Lombardo, C. Ciofi, “Current noise at the oxide hard breakdown”, Microelectronic Enigineering, Nov. 2001, vol. 59/1-4, pp. 43-47;

L. Fanucci, G.D’angelo, A.Monterastelli, M.Paparo, B.Neri, “Fully integrated low-noise-amplifier with high quality factor L-C filter for 1.8 GHz wireless applications”, International Symposium on Circuits and Systems, Sydney, Australia 2001, vol. 4, pp. 462-465;

F. Crupi, C. Ciofi, C. Pace, G. Iannaccone, B. Neri, “Noise as a probe of the charge transport mechanism through thin oxides in MOS structures”, Fluctuation and Noise letters, June 2001, num. 2, vol. 1, pp. 61-64;

F.Albertoni, L.Fanucci, B.Neri, E.Sentieri, “Tuned LNA for RFICs using boot-strapped inductor”, International Conference on Radiofrequency Integrated Circuits, Phoenix 2001, vol. 1, pp. 83-86;

S. Lombardo, F. Crupi, C. Gerardi, B. Neri, C. Spinella, “Dynamics of Intrinsic Breakdown in Thin Gate Oxides”, 197th Meeting of The Electrochemical Society, Toronto, 2000, vol. 1, pp. 40-;

C. Ciofi, B. Neri, “Low frequency noise measurements as a characterization tool for degradation phenomena in solid-state divices”, Journal of Physics D-Applied Physics, 2000, vol. 33, pp. 199-216;

V. Dattilo, B. Neri, C. Ciofi, “Low frequency noise evolution during lifetime tests of lines and vias subjected to electromigration”, Microelectronics Reliability, 2000, vol. 40, pp. 1323-1327;

F. Crupi, B. Neri, S. Lombardo, “Pre-breakdown in thin oxide films”, IEEE Electron Device Letters, 2000, vol. 21, pp. 319-321;

F. Crupi, G. Iannaccone, B. Neri, C. Ciofi, S. Lombardo, “Shot Noise Partial Suppression in the SILC Regime”, Microelectronics Reliability, 2000, vol. 40, pp. 1605-1608;

G. Iannacone, F. Crupi, B. Neri, S. Lombardo, “Suppressed shot noise in trap-assisted tunneling of metal-oxide-semiconductor capacitors”, Applied Physics Letters, 2000, vol. 77, pp. 2876-2878;

C. Ciofi, I. Ciofi, S. Di Pascoli.,B. Neri, “Temperature Controlled Oven for Low Noise Measurement Systems”, IEEE Transactions on Instrumentation and Measurement, 2000, num. 3, vol. 49, Issue 3, pp. 546-549;

B.Neri, F.Crupi, G.Basso, S.Lombardo, “A detailed Analysis of the Pre-Breakdown Current Fluctuations in Thin Oxide MOS Capacitors”, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, vol. 1, pp. 85-88, Singapore 1999;

B. Neri, F. Crupi, G. Basso, S. Lombardo, “A Detailed Analysis of the Pre-Breakdown Current Fluctuations in Thin Oxide MOS Capacitors”, Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits, Singapore, 1999, vol. 1, pp. 85-88;

C.Ciofi, V.Dattilo, B.Neri, Sean Foley, A.Mathewson, “Long Term Noise Measurements to Characterize Electromigration in Metal Lines of ICs”, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 1999, vol. 1, pp. 132-135;

F. Crupi, G. Iannaccone, B. Neri, I. Crupi, R. Degraeve, G. Groeseneken, H. E. Maes, “Origin of the Substrate Current after Soft-Breakdown in Thin Oxide n-MOSFETs”, 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, vol. 1, pp. 77-80, Singapore 1999; 

C.Ciofi, I.Ciofi, S.Di Pascoli, B.Neri, “Temperature Controlled Oven for Low Noise Measurement Systems”, Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference, Venezia, 1999, vol. 1, pp. 22-25;

G. Basso, F. Crupi, B. Neri, R. Giannetti, S. Lombardo, “A Novel Characterization Tool for the Study of Dielectric Breakdown of Ultra-Thin Oxide MOS Structures”, 16th IEEE Instrumentation and Measurement Technology Conference, Venezia, 1999, vol. 3, pp. 1923-1926;

G. Lombardi, B. Neri, “A new proof of unconditional stability criteria for microwave 2-port network”, IEEE Transactions on Microwave Theory and Techniques, 1999, vol. 47, pp. 746-751;

G. D’Angelo, A. Granchi, A. Monorchio, B. Neri, “Design and Simulation of Active Spiral Inductors for RF Integrated Circuits”, 1999 IEEE Antennas and Propagation Society International Symposium, , Orlando, FL, USA 1999, vol. 4, pp. 1836-1839;

G. D'Angelo, L. Fanucci, A. Monterastelli, B. Neri, “High Quality Active Inductors”, IEE Electronics Letters, Volume 35,  Issue 20,  30 Sept. 1999, pp.1727 - 1728 ;

C. Ciofi, V. Dattilo, B. Neri, Foley S. A. Mathewson, “Long term noise measurements and median time to failure  test for the characterization of Electromigration in metal lines”, Microelectronics Reliability, vol. 39, pp. 1691-1696, 1999;

G. Basso, C. Ciofi, I. Ciofi, F. Crupi, V. Dattilo, G. Iannaccone, S. Lombardo, B. Neri, “Low Frequency Noise and Failure Mechanisms in Microelectronic Devices”, final report, Dipartimento di Ingegneria dell'Informazione, Pisa, 1999;

F.Crupi, B.Neri, S.Lombardo, “On-Off Fluctuations of the Tunnel Current Before Breakdown of the Thin Oxide MOS Devices”, Adelaide, 1999, Proc. of Unsolved Problems on Noise and Fluctuations 99, vol. 1, pp. 407-411;

C.Ciofi, V.Dattilo, B.Neri, “Open Questions on Noise in Metal Lines Subjected to High Current Densities”, Proc. of Unsolved Problems on Noise and Fluctuations 99, Adelaide, 1999, vol. 1, pp. 483-487;

S. Lombardo, F. Crupi, C. Spinella, B. Neri, “Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors”, Materials Science in Semiconductor Processinf, num. 4, vol. 2, pp. 359-367, 1999;

A. Monorchio, G. D’Angelo, A. Granchi, B. Neri, “Voltage Controlled Active Inductors for Portable Communications IC’s”, XXVI General Assembly of the International Union of Radio Science - U.R.S.I, Toronto, Canada 1999, vol. 1, pp. 234;

S. Lombardo, F. Crupi, A. La Magna, C. Spinella, A. Terrasi, A. La Mantia, B. Neri, “Electrical and thermal transient during dielectric breakdown of thin oxides in metal-SiO2 silicon capacitors”, July 1998, Journal of Applied Physics, vol. 84, pp. 472-479;

G. Basso, V. Ciuti, F. Crupi, R. Giannetti, B. Neri, “Low noise Data Acquisition System for the Monitoring of the Current Tunneling through Thin Oxide Layers in MOS Devices”, Dipartimento di Ingegneria dell'Informazione, Pisa, 1998;

G. Basso, V. Ciuti, F. Crupi, R. Giannetti, B. Neri, “PC Based Low Noise Measurement System for the Characterization of Ultra Thin Oxide MOS Devices”, 10th International Symposium on Development in Digital Measuring Instrumentation, Napoli 1998, vol. 2, pp. 694-697;

C. Ciofi, R.Giannetti, B. Neri, “Temperature controlled multi oven for MTF tests”, Proceeding of Instrumentation and Measurement Technology Conference, St.Paul, MN, 18-21 May 1998, vol. 1, pp. 1282-1285;

C. Ciofi, G.Festa, R.Giannetti, B. Neri, “Ultra low noise, current to voltage converter with offset compensation independent of the source impedance”, Proc.of Instrumentation and Measurement Technology Conference, St.Paul, MN, May 1998, vol. 2, pp. 752-754;

C. Ciofi, R. Giannetti, B. Neri, “True Constant Temperature Measurement System for Lifetime Tests”, IEEE Transactions on Instrumentation and Measurement, Oct. 1998, num. 5, vol. 47, pp. 1187-1190;

C. Ciofi, R. Giannetti, V. Dattilo, B. Neri, “Ultra low noise current sources”, IEEE Transactions on Instrumentation and Measurement, Feb. 1998, num. 1, vol. 47, pp. 78-81;

C. Ciofi, M. Franzese, B. Neri, “Characterization of Al-Si-Cu metal lines by means of TEM analysis and the SARF Technique”, Microelectronics Reliability, 1997, vol. 37, pp. 1079-1084;

C. Ciofi, V. Dattilo, B. Neri, “Comments on the Utilization of Noise Measurements for the Characterization of Electromigration in Metal Lines”, Microelectronics Reliability, Vol. 37, Issue 10-11, pp. 1607-1610, Oct.-Nov. 1997;

B. Neri, C. Ciofi, V. Dattilo, “Noise and fluctuation in Al-Si interconnect lines”, IEEE Transactions on Electron Devices, Sept. 1997, vol. 44, Issue 9, pp. 1454-1459;

P. Bruschi, C. Ciofi, V. Dattilo, A. Diligenti, A. Nannini, B. Neri, “Copper Metallizations for Integrated Circuits: TEM Analysis and Electrical Characterization”, Journal of Electronic Materials, Aug. 1997, vol. 26, Issue 8,  pp. 17-20;

C.Ciofi, V.Dattilo, B.Neri, “Ultra Low Noise Measurement Systems”, Proceedings of the 14th International Conference Noise in Physical Systems and 1/f Fluctuations, (ICNF97) , 1997, vol. 1, pp. 597-600;

C.Ciofi, R.Giannetti, V.Dattilo, B.Neri, “Ultra low noise current sources”, Proceedings of IEEE Instrum. and Meas.Technology Conf. (IMTC97) , 19-21 May 1997, vol. 2, pp. 1486-1489;

L. Baracchino, G. Basso, C. Ciofi, B. Neri, “Ultra low noise, programmable, voltage source”, IEEE Transactions on Instrumentation and Measurement, 1997, vol. 46, Issue 6, pp. 1256-1261;

C. Ciofi, V. Dattilo, B. Neri, “Copper interconnection lines: technology, SARF characterization and TEM analysis”, Microelectronics Reliability, 1996, vol. 36, Issue 11-12, pp. 1747-1750;

P.E.Bagnoli, C.Ciofi, B.Neri, G.Pennelli, “Electromigration in Al based stripes: low frequency noise measurements and MTF test”, Microelectronics Reliability, 1996, vol. 36, pp. 1045-;

C.Ciofi, M.De Marinis, B.Neri, “Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits”, Proceedings of IEEE Instrumentation and Measurement Technology Conference, 1996, vol. 1, pp. 319-324;

C.Ciofi, M.De Marinis, B.Neri, “Wafer level Measurement system for noise characterization of Electromigration”, Microelectronics Reliability, 1996, vol. 36, pp. 1851-1854;

P. Bruschi, A. Nannini, B. Neri, “Vapour and gas sensing by noise measurements on polymeric balanced bridge microstructures”, Sensors and Actuators B Chemical, April 1995, pp. 429-432;

B. Neri, P. Olivo, R. Saletti, M. Signoretta, “Dielectric breakdown and reliability of MOS microstructures: traditional characterization and low-frequency noise measurements”, Microelectronics and Reliability, March 1995, pp. 529-537;

C. Ciofi, A. Diligenti, V. Dattilo, R. Gitto, B. Neri, “Dependence of the electromigration noise on the deposition temperature of the metal”, Proceedings of Ninth Symposium on Quality and Reliability in Electronics, March 1995, pp. 529-537;

G. Festa, B. Neri, “Thermally regulated low-noise, wideband, I/V converter, using Peltier heat pumps” IEEE Transaction on Instrumentation and Measurement, Dec. 1994, Vol. 43, Issue 6, pp. 900-905;

S. Chicca,C. Ciofi, A. Diligenti, A. Nannini, B. Neri, “Dependence of electromigration noise on geometrical and structural characteristics in aluminum-based resistors” IEEE Transaction on Electronic Devices, Nov. 1994, Vol. 41, Issue 11, pp. 2173, 2175;

P. Bruschi, F. Cacialli, A. Nannini, B. Neri,”Low-frequency resistance fluctuation measurements on conducting polymer thin-film resistors”, Journal of Applied Physics, 15 Sept. 1994, Vol. 76, Issue 6, pp. 3640-3644;

P. Bruschi, F. Cacialli, A. Nannini, B. Neri, “Gas and vapour effects on the resistance fluctuation spectra of conducting polymer thin-film resistors”, Sensors and Actuators B Chemical, April 1994, Vol. B19, Issue 1-3, pp. 421-425;

C. Ciofi, A. Diligenti, F. Giacomozzi, A. Nannini, B. Neri, “Low frequency electromigration noise and film microstructure in Al/Si stripes: electrical measurements and TEM analysis”, Journal of Electronic Materials, Nov. 1993, Vol. 22, Issue 11, pp. 1323-1326;

A. Diligenti, B. Neri, R. Saletti, “Low-frequency noise measurements as a complementary tool in the investigation of integrated circuit reliability” Microelectronics and Reliability, Nov. 1992, Vol. 32, Issue 11, pp. 1627-1631;

R. Saletti, B. Neri, “Low-noise automated measurement system for low-frequency current fluctuations in thin-oxide silicon structures”, IEEE Transactions on Instrumentation and Measurement, Feb. 1992, Vol. 41, Issue 1, pp. 123-127;

B. Neri, R. Saletti, “PC-based system for low-frequency current fluctuation measurements in thin-oxide silicon devices”, Noise in Physical Systems and 1/f Fluctuations, 1992, pp. 297-300;

R. Saletti, B. Neri, “Low-noise automated measurement system for low-frequency current fluctuations in thin-oxide silicon structures”, Instrumentation and Measurement Technology Conference, 14-16 May 1991, pp. 585-589;

A. Scorzoni, B. Neri, C. Caprile, F. Fantini, “Electromigration in thin-film interconnection lines: models, methods and results”, Material Science Reports, Dec. 1991, Vol. 7, Issue 4-5, pp. 143-220;

Diligenti, B. Neri, A. Nannini, S. Ciucci, “Variations of temperature coefficient and noise in thin Al and Al/Si resistors subjected to high current density”, Journal of Electronic Materials, July 1991, Vol. 20, Issue 7, pp. 559-565;

B. Neri, B. Pellegrini, R. Saletti, “Ultra low-noise preamplifier for low-frequency noise measurements in electron devices”, IEEE Transactions on Instrumentation and Measurement, Feb. 1991, Vol. 40, Issue 1, pp. 2-6;

R. Saletti, B. Neri, P. Olivo, A. Modelli, “Correlated fluctuations and noise spectra of tunneling and substrate currents before breakdown in thin-oxide MOS devices”, IEEE Transaction on Electron Devices, Nov. 1990, Vol. 37, Issue 11, pp. 2411-2413;

A. Neri, A. Diligenti, P. Aloe, V. A. Fine, “Electromigration in thin metal films: activation energy evaluation by means of noise technique. Results and open problems for indium and gold”, Vuoto Scienza e Tecnologia, Oct. Dec. 1989, Vol. 19, Issue 4, pp. 219-222;

A. Diligenti, P. E. Bagnoli, B. Neri, S. Bea, L. Mantellassi, “A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique”, Solid State Electronics, Jan. 1989, Vol. 32, Issue 1, pp. 11-16;

A. Diligenti, B. Neri, S. Ciucci, “Noise spectra and temperature coefficient variations in Al thin film resistors after electromigration tests”, ‘Proceedings of the International Conference on Materials and Process Characterization for VLSI (ICMPC-88), World Scientific, Singapore, 1988, pp. 470-473;

A. Diligenti, P. E. Bagnoli, B. Neri, G. Specchiulli, “Evaluation of electromigration activation energy by means of noise measurements and MTF tests”, Proceedings of the 17th European Solid State Device Research Conference (ESSDERC-'87), North-Holland, Amsterdam, Netherlands, 1988, pp. 365-368;

P. E. Bagnoli, A. Diligenti, B. Neri, S. Ciucci, “Noise measurements in thin-film interconnections: a nondestructive technique to characterize electromigration”, Journal of Applied Physics, 1 March 1988, Vol. 63, Issue 5, pp. 1448-1451;

B. Neri, A. Diligenti, P. E. Bagnoli, “Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections”, IEEE Transactions on Electron Devices, Nov. 1987, Vol. 34, Issue 11, pp. 2317-2322;

B. Neri, P. Olivo, B. Ricco, “Low-frequency noise in silicon-gate metal-oxide-silicon capacitors before oxide breakdown”, Applied Physics Letters, 21 Dec. 1987, Vol. 51, Issue 25, pp. 2167-2169;

A. Nannini, P. E. Bagnoli, A. Diligenti, B. Neri, S. Pugliese, “Conductivity variations induced by water vapor adsorption in granular metal films”, Journal of Applied Physics, 1 Sept. 1987, Vol. 62, Issue 5, pp.2138-2139;

B. Pellegrini, R. Saletti, B. Neri, P. Terreni, “Minimization of low frequency noise sources in electronic measurements”, 1st International Symposium on Measurement of Electrical Quantities: Noise in Electrical Measurements, Technoinform, Budapest, Hungary, 1986, pp. 195-200;

B. Neri, A. Diligenti, P. E. Bagnoli, P. Lagana, “Testing the electron devices reliability by means of noise measurements”, 1st International Symposium on Measurement of Electrical Quantities: Noise in Electrical Measurements, Technoinform, Budapest, Hungary, 1986, pp. 81-85;

B. Pellegrini, B. Neri, R. Saletti, “Minimum number of Lorentzian spectra sufficient to yield 1/f/sup gamma / spectrum”, Alta Frequenza, July-Aug. 1986, Vol. 55, Issue 4, pp. 245-253;

B. Pellegrini, R. Saletti, B. Neri, P. Terreni, “1/f/sup nu / noise generators“, Proceedings of the 8th International Conference on `Noise in Physical Systems' and the 4th International Conference on `1/f-Noise', North Holland, Amsterdam, Netherlands, 1986, pp. 425-428;

A. Diligenti, B. Neri, P. E. Bagnoli, A. Barsanti, M. Rizzo, “Electromigration detection by means of low-frequency noise measurements in thin-film interconnections”, IEEE Electron Device Letters, Nov. 1985, Vol. 6, Issue 11, pp. 606-668;

G. E. Noci, B. Neri, P. Terreni, “Equivalent circuit and statistics of burst noise in bipolar transistors”, Alta Frequenza, March-April 1983, Vol. 53, Issue 2, pp. 89-97;